Record Details

Title:
Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, W. Katz, P. Williams
Author(s):
Katz, W. (William), 1953-
Williams, P. (Peter), 1942-
Imprint:
Pittsburgh, Pa. : Materials Research Society, c1985
Description:
xiii, 483 p. : ill. ; 24 cm
ISBN:
0931837138 :
Subject(s):
Series:
Materials Research Society symposia proceedings ; v. 48
Bibliography, etc. note:
Includes bibliographies and indexes
Formatted contents note
Atomic ordering of materials and chemical bonding analysis materials
Microstructures of materials and elemental analysis
Materials characteriation with ion beams
High energy methods and materials chracterization using phooton beams
Record appears in:


Holdings
Options Library Call no Location Description Item type Status Due date
Sherman Fairchild Library TA410 .A67 1985 SFL 2 books c.1 Book on shelf -


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 Record created 2015-09-17, last modified 2015-09-23


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